Multi-Chamber MBE Research Tool

One-of-a-kind, DCA Instruments based custom research tool used for crystal growth combined with in-situ analysis which allows for examination of crystal growth processes on a layer-by-layer basis.

Pulsed Laser Deposition

All deposition system have RHEED for in-situ monitoring of crystallinity and lattice constant. In addition there are ports for addition of ellipsometry to monitor the dielectric properties of thin films during growth.